The aim of the trip was to carry laboratory analyses of zircon grains separated from rock samples from Antarcica. Investigations were performed in the laboratories of the Advanced Facility for Microscopy and Microanalysis and the following method were used during the work: Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT). Samples were prepared using the focused ion beam (FIB) technique.
The analyses allowed to get information on the microstructure and chemical composition of the samples, which is important in the study of the mechanisms of migration and redistribution of lead in zircon.
